If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much testing required. However, boards today contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]

It’s the return of the Gadget Smackdown, brought to you by EE Live!  This year, the SMACKDOWN takes place April 1–3 in the EE Times Fantastical Theater of Engineering Innovation at the San Jose convention Center, where the EE Live! Conference and Expo is being held. The presser for this event encourages anyone who loves […]