Posts Tagged ‘JTAG Test Software’

Posted on March 1, 2020 in flynn systems, JTAG

When large numbers of outputs switch simultaneously, they can cause intermittency with your test due the ground bounce effect. JTAG Test with onTAP lets you control this problem by giving you control over how many outputs switch during a single test scan, as shown below:   Understanding ground bounce In manufacturing test environments, it’s not […]

Posted on November 1, 2019 in Boundary Scan, JTAG, JTAG Boundary Scan

That’s an easy one. With onTAP’s TAP CONNECT JTAG Controller, you can run an unlimited number of chains simultaneously. Each TAP CONNECT JTAG Controller has two channels which provides the opportunity to run two chains at once. Furthermore, additional chains are handled with ease by additional Controllers. In fact, there are no restrictions on the […]

Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]

Posted on May 6, 2015 in Boundary Scan, JTAG Boundary Scan, onTAP JTAG Blog

Who cares. The owner of the problem is not necessarily always the issue. Blame most often gets thrown around the work place when things don’t work, and a resolution is needed.