In today’s world, there’s no avoiding technology. Whether you consider yourself “tech savvy” or not, there’s no escaping the continuously changing expectations of society. However, with the increasing demands comes a need for increased security.
Posts Tagged ‘JTAG’
When large numbers of outputs switch simultaneously, they can cause intermittency with your test due the ground bounce effect. JTAG Test with onTAP lets you control this problem by giving you control over how many outputs switch during a single test scan, as shown below: Understanding ground bounce In manufacturing test environments, it’s not […]
Are you new to boundary scans and JTAG? Take a look at this quick guide to understanding what exactly it means, and why JTAG is essential. JTAG stands for Joint Test Action Group. When referred to as part of a boundary scan test, it means computer chips and electronic devices that are made according to […]
Once a board developer passes along the new board and all related files and procedures to a test developer, the boundary scan test process can begin. We recommend including the TAP Integrity Test at the beginning of your interconnect test because the TAP contains pins associated with the test access controller, e g., the TAP […]
Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]
It’s the return of the Gadget Smackdown, brought to you by EE Live! This year, the SMACKDOWN takes place April 1–3 in the EE Times Fantastical Theater of Engineering Innovation at the San Jose convention Center, where the EE Live! Conference and Expo is being held. The presser for this event encourages anyone who loves […]
We are constantly exposed to new situations in boundary scan test and new approaches to using boundary scan to achieve better test fault coverage. One item standing in the way of higher, more accurate fault coverage is common tri-state control cells.
FOR IMMEDIATE RELEASE Contact: Ryan Flynn Flynn Systems Corp. 74 Northeastern Blvd, STE 16A Nashua, NH 03062 603-598-4444 Sales@flynn.com onTAP Series 4000: Escape Communications Embedded JTAG Test and Programming Solution NASHUA, NH April 3, 2009 – Flynn Systems Corp is proud to announce that Escape Communications, of Torrance, California, (www.escapecom.com), a trusted provider of point-to-point […]
(text version – download PDF version here) The challenge: Escape Communications of Torrance, CA (www.escapecom.com), a trusted provider of point-to-point microwave radio indoor units (IDUs) for commercial telecommunications OEMs and custom advanced signal processing designs for major space and defense contractors, sought to improve their physical user interface for testing, especially during the manufacturing process. […]