Posts Tagged ‘IEEE 1149.1’

Posted on November 15, 2008 in Boundary Scan, Boundary Scan Test, Press Releases

The goal is to exploit JTAG testing to achieve maximum fault coverage in addition to Flash programming and configuration tasks,” says Hank Flynn, CEO of Flynn Systems Corp. Like so many new features added to onTAP, Flynn’s introduction of the upgraded ATPG was a direct result of meeting customer needs. “Even if a tool has the capability to provide high fault coverage, when too much user intervention is required, chances are fault coverage goals will never be achieved. It’s clear that increased automation throughout the test prep experience is the key.” Says Flynn.

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Flynn Systems