Posts Tagged ‘Flynn Systems’

Posted on September 2, 2020 in JTAG Boundary Scan

Formed in 1985, Joint Test Action Group (JTAG) developed a method of verifying designs and testing printed circuit boards after manufacture. This method would later become the industry standard. Known as a JTAG test,.

Posted on July 1, 2020 in circuit trace testing

In today’s world, there’s no avoiding technology. Whether you consider yourself “tech savvy” or not, there’s no escaping the continuously changing expectations of society. However, with the increasing demands comes a need for increased security.

If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much testing required. However, boards today contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]

Posted on November 1, 2019 in Boundary Scan, JTAG, JTAG Boundary Scan

That’s an easy one. With onTAP’s TAP CONNECT JTAG Controller, you can run an unlimited number of chains simultaneously. Each TAP CONNECT JTAG Controller has two channels which provides the opportunity to run two chains at once. Furthermore, additional chains are handled with ease by additional Controllers. In fact, there are no restrictions on the […]

Posted on September 1, 2019 in Boundary Scan, Boundary Scan Test, flynn systems

Boundary scan testing can help you debug your devices, but what do you do when a bug has you completely stumped?

If you are designing PCBs, then circuit trace testing is an essential step in the process.

Today’s consumer is provided a variety of options no matter what the subject matter happens to be.  At Flynn Systems we like to keep things simple by providing the best solution in boundary scan options.  Saving the consumer both time and money by avoiding trial and error software, Flynn’s boundary scan is no nonsense and […]

Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]