New technologies in aerospace are constantly being built, tested, approved and launched. For example in 2019, Virgin Orbit launched LauncherOne, outfitting a Boeing 747 to launch the 70ft long rocket from its left wing into outer space. The rocket successfully entered space and the plane returned back to solid ground to fly again another day. […]
Posts Tagged ‘Boundary Scan Testing’
In an age where technology is king, electric systems have become part of everyday life. From our smartphones to medical equipment every piece of technology has been able to advance, thanks to rapid changes in how we work with electric systems. Innovation and creation are only able to be implemented in society if they have […]
Engineering has many different branches that students can expand into as they complete their college degrees and begin searching in the field for a position. Within the world of electric engineering is the smaller yet essential area of electronic engineering. This area of study can be found at universities like USC and the University of […]
Mid-state shorts are a major problem that often goes undetected by typical boundary scan connectivity tests is mid-state/resitive shorts. Flynn Systems recognized this “hole” in boundary scan testing and was the first boundary scan test company to test for mid-state shorts, improving test fault coverage.
The boundary scan test software provides a way to interconnect between integrated circuits (ICs) on a board without using physical test probes. The scan contains cells within a device that can capture data from pin or core logic signals or force data onto pins. The captured data is moved out and externally compared to other […]
Today’s consumer is provided a variety of options no matter what the subject matter happens to be. At Flynn Systems we like to keep things simple by providing the best solution in boundary scan options. Saving the consumer both time and money by avoiding trial and error software, Flynn’s boundary scan is no nonsense and […]
Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]