Posts Tagged ‘boundary scan test’

Posted on November 1, 2020 in Boundary Scan Test, JTAG Boundary Scan, onTAP Usage

Mid-state shorts are a major problem that often goes undetected by typical boundary scan connectivity tests is mid-state/resitive shorts. Flynn Systems recognized this “hole” in boundary scan testing and was the first boundary scan test company to test for mid-state shorts, improving test fault coverage.

Posted on July 1, 2020 in circuit trace testing

In today’s world, there’s no avoiding technology. Whether you consider yourself “tech savvy” or not, there’s no escaping the continuously changing expectations of society. However, with the increasing demands comes a need for increased security.

Posted on April 29, 2020 in Boundary Scan, Boundary Scan Test

The boundary scan test software provides a way to interconnect between integrated circuits (ICs) on a board without using physical test probes. The scan contains cells within a device that can capture data from pin or core logic signals or force data onto pins. The captured data is moved out and externally compared to other […]

Posted on September 1, 2019 in Boundary Scan, Boundary Scan Test, flynn systems

Boundary scan testing can help you debug your devices, but what do you do when a bug has you completely stumped?

Today’s consumer is provided a variety of options no matter what the subject matter happens to be.  At Flynn Systems we like to keep things simple by providing the best solution in boundary scan options.  Saving the consumer both time and money by avoiding trial and error software, Flynn’s boundary scan is no nonsense and […]

Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]

We are constantly exposed to new situations in boundary scan test and new approaches to using boundary scan to achieve better test fault coverage. One item standing in the way of higher, more accurate fault coverage is common tri-state control cells.

Posted on November 17, 2009 in Boundary Scan, Boundary Scan Test, onTAP JTAG Blog, Product News

We insure that your boundary scan tests are maximized for the highest possible fault coverage, are completely debugged, and are ready to put in the hands of test engineers on the manufacturing floor, so all they have to do is “press a button.”
We support our tests and we will support your manufacturer by answering questions and bringing them up-to-speed with boundary scan test and onTAP.

Posted on October 30, 2009 in JTAG Boundary Scan, onTAP, onTAP JTAG Blog, onTAP Usage

Ontap_parallel.exe can be used to simultaneously run test suites on multiple PC boards using the onTAP DLL. Parallel board testing must be enabled for the DLL license. Testing is fastest on a multiple processor PC , particularly where one core processor is available for each board. For example if four PC boards are being tested in parallel, then a quad core processor is recommended so that the time to test four boards is about the same as that required to test one board.

Posted on November 15, 2008 in Boundary Scan, Boundary Scan Test, Press Releases

The goal is to exploit JTAG testing to achieve maximum fault coverage in addition to Flash programming and configuration tasks,” says Hank Flynn, CEO of Flynn Systems Corp. Like so many new features added to onTAP, Flynn’s introduction of the upgraded ATPG was a direct result of meeting customer needs. “Even if a tool has the capability to provide high fault coverage, when too much user intervention is required, chances are fault coverage goals will never be achieved. It’s clear that increased automation throughout the test prep experience is the key.” Says Flynn.