Posts Tagged ‘ate JTAG test’

Posted on June 16, 2021 in onTAP JTAG Blog

Flynn Systems developed a proprietary debugging software known as . This software allows the user to pinpoint specific bugs and increases visibility to JTAG testing. End users are able to access pins by wiggling or single stepping. This also allows them the ability to make changes to the test properties allowing a greater ability to […]

Posted on April 15, 2021 in onTAP JTAG Blog

In the world of every evolving and changing technology, boundary scan has played a large part in getting new items to the market. Boundary scan was created in an effort to make accessibility to testing multiple boards with a single system. To help you better understand why you should make the switch to boundary scan […]

Posted on January 27, 2021 in onTAP JTAG Blog

Engineering has many different branches that students can expand into as they complete their college degrees and begin searching in the field for a position. Within the world of electric engineering is the smaller yet essential area of electronic engineering.  This area of study can be found at universities like USC and the University of […]

Posted on March 1, 2020 in flynn systems, JTAG

When large numbers of outputs switch simultaneously, they can cause intermittency with your test due the ground bounce effect. JTAG Test with onTAP lets you control this problem by giving you control over how many outputs switch during a single test scan, as shown below:   Understanding ground bounce In manufacturing test environments, it’s not […]

Posted on June 12, 2017 in JTAG, JTAG Boundary Scan, onTAP, onTAP JTAG Blog

Once a board developer passes along the new board and all related files and procedures to a test developer, the boundary scan test process can begin. We recommend including the TAP Integrity Test at the beginning of your interconnect test because the TAP contains pins associated with the test access controller, e g., the TAP […]

Left Menu Icon
Flynn Systems