FS-ATG Test Vector Generation Service

FS-ATG Test

Vector Generation Service

Flynn Systems continues to offer the FS-ATG Software and Test Vector Generation Service as an economical way to get test vectors for your immediate ICT PLD and FPGA testing needs.

Our Test Vector Generation Service provides accurate, reliable test vectors for PALs, GALs, CPLDs and FPGAs from well-known device manufacturers (Xilinx, Actel, Altera, Lattice,  etc.). In most cases, you can expect results within 24 hours.

See our pricing here!

The FS-ATG Test Vector Generation Service includes:

Fault Coverage
Generation of package pin and/or internal node Stuck-At faults.

Testability Reports
Detailed reports of the device performance, fault-scoring summaries, DFT information, state-transition information, logic analysis and edge-pin summary.

Test Vectors in your ATE Format
A sample of available output formats include:

  • GenRad 228x/227x DTS
  • GenRad 275x TGL
  • HP 3065/3070 VCL
  • HP 3065/3070 PCF
  • Teradyne Z1800 ASC
  • Teradyne Z8000 Z80
  • Teradyne L Series SYM & CHA
  • ViewLogic VL
  • Altera VEC
  • JEDEC JWV

How to get started
To get started, please send us your device source files and either tell us how the devices are constrained (pins connected/ignored), and tied to VCC/GND or send us the board netlist file (GenRad .CKT, HP board, or Teradyne IPL.DAT).  FS-ATG software extracts that information automatically for each device on your board.

Send files via email to [email protected]

Products

Product Documentation

onTAP Turnkey Service

And Update Requests

FS-ATG Test Vector Generation Service

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SVF File Generation Service

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onTAP JTAG Controllers for Test & Programming