Design-For-Testability (DFT) analysis and checking the DFT compliance of customer’s design before board layout and on all stages of the product lifecycle
JTAG (Boundary Scan) test program development, including on-board programming of CPLD, FPGA, flash, I2C, with different tools and platforms
ICT test program development for the Teradyne Z18xx testers with full test process support on the customer production facility
Flynn Systems Corp.(www.flynn.com) has provided test, debug, and programming solutions for the Boundary Scan test standard (JTAG IEEE 1149.1) for over ten years. Their onTAP software package delivers completely automated Boundary Scan testing for devices of all levels of complexity on printed circuit boards (PCB) and non-Boundary Scan devices interacting with the scan enabled devices. onTAP’s functionality also includes the capability to program flash devices using only the onTAP USB Test and Programming Cable. Flynn Systems Corp. provides high level test suites and the highest fault coverage available with a powerful ATG engine: all backed by fast, responsive technical support. Its satisfied customers include Intel, Qualcomm, Harris RF, Benchmark Electronics, Raytheon, L-3 Communications, Cadence Design, Teradyne, Checkpoint Systems, Ulticom, and University of Arizona. Flynn Systems’ onTAP provides Boundary Scan services for university research, avionics, defense systems, consumer goods, and medical electronics. It is based in New Hampshire with distributors and partners in Europe and in the Middle East.