JTAG

JTAG Test Can Eliminate the “Ground Bounce” Effect

JTAG Test Can Eliminate the “Ground Bounce” Effect

When large numbers of outputs switch simultaneously, they can cause intermittency with your test due the ground bounce effect. JTAG Test with onTAP lets you control this problem by giving you control over how many outputs switch during a single test scan, as shown...

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How Test Developers Can Save Their Company Time and Money

How Test Developers Can Save Their Company Time and Money

If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much testing required. However, boards today contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the...

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How to handle multiple boundary scan chains

How to handle multiple boundary scan chains

That’s an easy one. With onTAP’s TAP CONNECT JTAG Controller, you can run an unlimited number of chains simultaneously. Each TAP CONNECT JTAG Controller has two channels which provides the opportunity to run two chains at once. Furthermore, additional chains are...

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Finding Faults with the Test Access Port (TAP)

Finding Faults with the Test Access Port (TAP)

Once a board developer passes along the new board and all related files and procedures to a test developer, the boundary scan test process can begin. We recommend including the TAP Integrity Test at the beginning of your interconnect test because the TAP contains pins...

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Testing Multichip Modules

Testing Multichip Modules

Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs...

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Manufacturing: Save Yourself, & The Project, Lots Of Money!

Now that your board has moved from prototyping to manufacturing, things are humming along until...there is a snag in manufacturing. Suddenly an entire run of boards is failing for unknown reasons, and you’re already dangerously close to being behind schedule. What to...

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Calling Inspector Gadget

It’s the return of the Gadget Smackdown, brought to you by EE Live!  This year, the SMACKDOWN takes place April 1–3 in the EE Times Fantastical Theater of Engineering Innovation at the San Jose convention Center, where the EE Live! Conference and Expo is being held....

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Boundary Scan that Fits Your Budget

I thought it was important to post something about onTAP being the perfect boundary scan solution for any JTAG user, but especially those in budget critical situations after some weekend reading brought me across a couple of articles in Electronics Weekly about...

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Groundhog Day Sale

  EVERYTHING YOU NEED Nashua, NH by-way-of Gobbler’s Nob, Punxsutawney, Pennsylvania – Well, it’s official! The groundhog poked out and saw its shadow.  Settle in for six more weeks of winter.  The upside is, you have six more weeks to not worry about nice sunny...

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Happy New Year – Welcome 2010

We hope everyone is off to a strong and promising 2010.   By all signs, it appears that this year will deliver new innovations and products to the electronics market.  We certainly are excited to hear about our customers new projects and are looking forward to sharing...

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JTAG.TECT Reviews onTAP JTAG System

                                                                                     Written by: Dr. Ami Gorodetsky of JTAG.TECT Please follow this link for the original Russian: http://www.jtag-test.ru/JTAGUniversity/articles/12-PE_6_2009.php View Dr. Ami...

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30 MHz High Speed Boundary Scan Testing & Programming

Boundary scan testing and programming is gaining popularity with designers, developers, and as a result, manufacturers. It is the responsibility of boundary scan test vendors to develop and provide end users with tools that are faster, more flexible, more robust, and...

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PC Based Parallel JTAG Testing

Flynn Systems Corp announces support for PC based parallel JTAG testing and programming. Keeping with the value based approach to delivering boundary scan test solutions, Flynn Systems has harnessed the power of the multi-core processor to divide tasks, enabling users...

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Built In Self Test (BIST)

Tests may be defined in script files which may then be translated into executable Serial Vector Format (SVF) files. The general approach is to place all of the required BSDL files into a folder and then to relate the BSDL files to circuit locations in declarations at...

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onTAP Managing Differential I/O Pairs

To manually specify differential pairs, proceed through test development, to the SETTINGS PAGE and click the Identify Differential Pairs button.   Automatic Detection onTAP automatically recognizes and accounts for differential I/O pairs as they are declared in...

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onTAP Supported Netlist Readers

These are some of the available netlist formats. If your netlist reader is not supported, just contact Flynn Systems and we’ll make one for your project. Netlist Format File Extensions Comments GenRad .CKT For ATE at Board Test GenCad .NET EDIF .EDN or .EDF  Allegro...

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