Formed in 1985, Joint Test Action Group (JTAG) developed a method of verifying designs and testing printed circuit boards after manufacture. This method would later become the industry standard. Known as a JTAG test,.
JTAG Boundary Scan
If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much testing required. However, boards today contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]
That’s an easy one. With onTAP’s TAP CONNECT JTAG Controller, you can run an unlimited number of chains simultaneously. Each TAP CONNECT JTAG Controller has two channels which provides the opportunity to run two chains at once. Furthermore, additional chains are handled with ease by additional Controllers. In fact, there are no restrictions on the […]
Understanding boundary scans means you need to understand the tools used when performing them. Take a look at our quick guide to boundary scan tools and make sure you have all you need. JTAG Device This refers to the device being tested during the boundary scan. Any device that is JTAG enabled will have information […]
Are you new to boundary scans and JTAG? Take a look at this quick guide to understanding what exactly it means, and why JTAG is essential. JTAG stands for Joint Test Action Group. When referred to as part of a boundary scan test, it means computer chips and electronic devices that are made according to […]
Once a board developer passes along the new board and all related files and procedures to a test developer, the boundary scan test process can begin. We recommend including the TAP Integrity Test at the beginning of your interconnect test because the TAP contains pins associated with the test access controller, e g., the TAP […]
Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]
One of the most common comments we hear from our customers and business partners sounds something like this: “Well, I’ve heard about boundary scan testing, and have actually used it a bit before. Moving forward, we have a new project we need to use it on, and we have a bone pile I might get to.”
Now that your board has moved from prototyping to manufacturing, things are humming along until…there is a snag in manufacturing. Suddenly an entire run of boards is failing for unknown reasons, and you’re already dangerously close to being behind schedule.