JTAG

Posted on November 1, 2019 in Boundary Scan, JTAG, JTAG Boundary Scan

That’s an easy one. With onTAP’s TAP CONNECT JTAG Controller, you can run an unlimited number of chains simultaneously. Each TAP CONNECT JTAG Controller has two channels which provides the opportunity to run two chains at once. Furthermore, additional chains are handled with ease by additional Controllers. In fact, there are no restrictions on the […]

onTAP circuit trace tests allow you to quickly and easily measure boundary scan pins on your PC. Circuit trace adds a rich, natural language scripting tool that enables algorithmic flexibility.

Posted on June 12, 2017 in JTAG, JTAG Boundary Scan, onTAP, onTAP JTAG Blog

Once a board developer passes along the new board and all related files and procedures to a test developer, the boundary scan test process can begin. We recommend including the TAP Integrity Test at the beginning of your interconnect test because the TAP contains pins associated with the test access controller, e g., the TAP […]

Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]

If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much required testing. However, today’s boards contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]

Now that your board has moved from prototyping to manufacturing, things are humming along until…there is a snag in manufacturing. Suddenly an entire run of boards is failing for unknown reasons, and you’re already dangerously close to being behind schedule.

Posted on March 18, 2014 in Boundary Scan, JTAG, JTAG Boundary Scan, onTAP, onTAP JTAG Blog

It’s the return of the Gadget Smackdown, brought to you by EE Live!  This year, the SMACKDOWN takes place April 1–3 in the EE Times Fantastical Theater of Engineering Innovation at the San Jose convention Center, where the EE Live! Conference and Expo is being held. The presser for this event encourages anyone who loves […]

Posted on March 10, 2013 in Documentation, JTAG, JTAG Boundary Scan, onTAP

When large numbers of outputs switch simultaneously, they can cause intermittency with your test due the ground bounce effect. onTAP lets you control this problem by giving you control over how many outputs switch during a single test scan, as shown below:    

Posted on August 23, 2010 in Boundary Scan, JTAG, onTAP, onTAP JTAG Blog, Product News

I thought it was important to post something about onTAP being the perfect boundary scan solution for any JTAG user, but especially those in budget critical situations after some weekend reading brought me across a couple of articles in Electronics Weekly about boundary scan useage and budgetary demands.  One article from April 28, 2010 titled Boundary Scan […]

Posted on July 29, 2010 in Boundary Scan, JTAG, JTAG Boundary Scan, onTAP, Press Releases

Nashua, NH July, 2010 – Flynn Systems Corp (FSC), developer of onTAP Boundary Scan Solutions, and Solution Sources Programming (SSP), the test technology leader in strategies and development of Benchtop Boundary Scan, ICT, and Functional Test, have established a new strategic relationship. Flynn Systems’ has made Solution Sources Programming, Inc. their new onTAP JTAG  Boundary Scan […]