Boundary Scan Test

Posted on September 1, 2019 in Boundary Scan, Boundary Scan Test, flynn systems

Boundary scan testing can help you debug your devices, but what do you do when a bug has you completely stumped?

Today’s consumer is provided a variety of options no matter what the subject matter happens to be.  At Flynn Systems we like to keep things simple by providing the best solution in boundary scan options.  Saving the consumer both time and money by avoiding trial and error software, Flynn’s boundary scan is no nonsense and […]

onTAP circuit trace tests allow you to quickly and easily measure boundary scan pins on your PC. Circuit trace adds a rich, natural language scripting tool that enables algorithmic flexibility.

Posted on January 30, 2018 in Boundary Scan Test, JTAG Boundary Scan

Understanding boundary scans means you need to understand the tools used when performing them. Take a look at our quick guide to boundary scan tools and make sure you have all you need. JTAG Device This refers to the device being tested during the boundary scan. Any device that is JTAG enabled will have information […]

Posted on January 20, 2018 in Boundary Scan, Boundary Scan Test, JTAG Boundary Scan

Are you new to boundary scans and JTAG? Take a look at this quick guide to understanding what exactly it means, and why JTAG is essential. JTAG stands for Joint Test Action Group. When referred to as part of a boundary scan test, it means computer chips and electronic devices that are made according to […]

Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]

If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much required testing. However, today’s boards contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]

Posted on February 10, 2017 in Boundary Scan, Boundary Scan Test, onTAP JTAG Blog

Not every boundary scan application experiences delays. Some run without any problems, but when there is a delay, oftentimes it can be traced back to lack of information from the board’s developer to the board’s tester.

Posted on May 11, 2016 in Boundary Scan Test, onTAP JTAG Blog

Introduction As miniaturization of PCBs became more desirable, denser (or layered) printed circuit boards began to dominate the market. Testing electrical connectivity between devices posed a huge problem because  board density and complex layering prevented the IC pins from being physically probed. The Joint Test Action Group (JTAG) developed a solution: boundary scan. The Joint Test […]

Now that your board has moved from prototyping to manufacturing, things are humming along until…there is a snag in manufacturing. Suddenly an entire run of boards is failing for unknown reasons, and you’re already dangerously close to being behind schedule.