Mid-state shorts are a major problem that often goes undetected by typical boundary scan connectivity tests is mid-state/resitive shorts. Flynn Systems recognized this “hole” in boundary scan testing and was the first boundary scan test company to test for mid-state shorts, improving test fault coverage.
Boundary Scan Test
The boundary scan test software provides a way to interconnect between integrated circuits (ICs) on a board without using physical test probes. The scan contains cells within a device that can capture data from pin or core logic signals or force data onto pins. The captured data is moved out and externally compared to other […]
If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much testing required. However, boards today contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]
Today’s consumer is provided a variety of options no matter what the subject matter happens to be. At Flynn Systems we like to keep things simple by providing the best solution in boundary scan options. Saving the consumer both time and money by avoiding trial and error software, Flynn’s boundary scan is no nonsense and […]
Understanding boundary scans means you need to understand the tools used when performing them. Take a look at our quick guide to boundary scan tools and make sure you have all you need. JTAG Device This refers to the device being tested during the boundary scan. Any device that is JTAG enabled will have information […]
Are you new to boundary scans and JTAG? Take a look at this quick guide to understanding what exactly it means, and why JTAG is essential. JTAG stands for Joint Test Action Group. When referred to as part of a boundary scan test, it means computer chips and electronic devices that are made according to […]
Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]
Not every boundary scan application experiences delays. Some run without any problems, but when there is a delay, oftentimes it can be traced back to lack of information from the board’s developer to the board’s tester.
Introduction As miniaturization of PCBs became more desirable, denser (or layered) printed circuit boards began to dominate the market. Testing electrical connectivity between devices posed a huge problem because board density and complex layering prevented the IC pins from being physically probed. The Joint Test Action Group (JTAG) developed a solution: boundary scan. The Joint Test […]