FS-ATG Test Vector Generation Service
Flynn Systems continues to offer the FS-ATG Software and Test Vector Generation Service as an economical way to get test vectors for your immediate ICT PLD and FPGA testing needs.
Our Test Vector Generation Service provides accurate, reliable test vectors for PALs, GALs, CPLDs and FPGAs from well-known device manufacturers (Xilinx, Actel, Altera, Lattice, etc.). In most cases, you can expect results within 24 hours.
The FS-ATG Test Vector Generation Service includes:
Generation of package pin and/or internal node Stuck-At faults.
Detailed reports of the device performance, fault-scoring summaries, DFT information, state-transition information, logic analysis and edge-pin summary.
Test Vectors in your ATE Format
A sample of available output formats include:
GenRad 228x/227x DTS
GenRad 275x TGL
HP 3065/3070 VCL
HP 3065/3070 PCF
Teradyne Z1800 ASC
Teradyne Z8000 Z80
Teradyne L Series SYM & CHA
How to get started
To get started, please send us your device source files (see list of source files) and either tell us how the devices are constrained (pins connected/ignored), and tied to VCC/GND or send us the board netlist file (GenRad .CKT, HP board, or Teradyne IPL.DAT). FS-ATG software extracts that information automatically for each device on your board.
Send files via email to email@example.com
If you are looking for more information about FS-ATG, please follow this link: https://flynn.com/files/fsatg.php