onTAP JTAG Blog

Posted on July 1, 2020 in circuit trace testing

In today’s world, there’s no avoiding technology. Whether you consider yourself “tech savvy” or not, there’s no escaping the continuously changing expectations of society. However, with the increasing demands comes a need for increased security.

Posted on April 29, 2020 in Boundary Scan, Boundary Scan Test

The boundary scan test software provides a way to interconnect between integrated circuits (ICs) on a board without using physical test probes. The scan contains cells within a device that can capture data from pin or core logic signals or force data onto pins. The captured data is moved out and externally compared to other […]

Posted on March 1, 2020 in flynn systems, JTAG

When large numbers of outputs switch simultaneously, they can cause intermittency with your test due the ground bounce effect. JTAG Test with onTAP lets you control this problem by giving you control over how many outputs switch during a single test scan, as shown below:   Understanding ground bounce In manufacturing test environments, it’s not […]

If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much testing required. However, boards today contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]

Posted on November 1, 2019 in Boundary Scan, JTAG, JTAG Boundary Scan

That’s an easy one. With onTAP’s TAP CONNECT JTAG Controller, you can run an unlimited number of chains simultaneously. Each TAP CONNECT JTAG Controller has two channels which provides the opportunity to run two chains at once. Furthermore, additional chains are handled with ease by additional Controllers. In fact, there are no restrictions on the […]