Posted on May 6, 2015 in Boundary Scan, JTAG Boundary Scan, onTAP JTAG Blog

Who cares. The owner of the problem is not necessarily always the issue. Blame most often gets thrown around the work place when things don’t work, and a resolution is needed.

Posted on April 29, 2015 in Boundary Scan, JTAG Boundary Scan, onTAP JTAG Blog

One of the most common comments we hear from our customers and business partners sounds something like this: “Well, I’ve heard about boundary scan testing, and have actually used it a bit before. Moving forward, we have a new project we need to use it on, and we have a bone pile I might get to.”

Now that your board has moved from prototyping to manufacturing, things are humming along until…there is a snag in manufacturing. Suddenly an entire run of boards is failing for unknown reasons, and you’re already dangerously close to being behind schedule.

Posted on April 15, 2015 in onTAP JTAG Blog

In our last discussion, we talked about DFT, which plays a significant role in reducing costs in prototyping. There are a wide variety of reasons that prototyping is a significant expense in the development and production processes. A large part of the cost is the increasing complexity of designs, inclusion of more processors and FPGA’s, greatly reduced board real estate, and diminishing test access. With the cost of FPGA’s and processors rising as they too become more powerful, getting small batches of devices is expensive. If one of those devices is fried during prototype testing, the cost to prototype a new design escalates rapidly, especially if the cause of the failure isn’t quickly determined.

Posted on April 8, 2015 in onTAP JTAG Blog

Design for Testability, often referred to as DFT, is a critical part of developing a new board. Here’s a link to a terrific class lecture from University of Maryland if you’re interested in seeing a well represented academic presentation of such an important topic.