If a chain of devices consisted only of boundary scan (JTAG) compliant devices, there would not be too much required testing. However, today’s boards contain complex, non-JTAG devices that interact with the boundary scan devices. Testing just the JTAG devices on the board is always an option. However, developing a test that takes into account […]

Posted on February 10, 2017 in Boundary Scan, Boundary Scan Test, onTAP JTAG Blog

Not every boundary scan application experiences delays. Some run without any problems, but when there is a delay, oftentimes it can be traced back to lack of information from the board’s developer to the board’s tester.

Posted on May 11, 2016 in Boundary Scan Test, onTAP JTAG Blog

Introduction As miniaturization of PCBs became more desirable, denser (or layered) printed circuit boards began to dominate the market. Testing electrical connectivity between devices posed a huge problem because  board density and complex layering prevented the IC pins from being physically probed. The Joint Test Action Group (JTAG) developed a solution: boundary scan. The Joint Test […]

Posted on May 6, 2015 in Boundary Scan, JTAG Boundary Scan, onTAP JTAG Blog

Who cares. The owner of the problem is not necessarily always the issue. Blame most often gets thrown around the work place when things don’t work, and a resolution is needed.

Posted on April 29, 2015 in Boundary Scan, JTAG Boundary Scan, onTAP JTAG Blog

One of the most common comments we hear from our customers and business partners sounds something like this: “Well, I’ve heard about boundary scan testing, and have actually used it a bit before. Moving forward, we have a new project we need to use it on, and we have a bone pile I might get to.”