onTAP JTAG Blog

Posted on January 30, 2018 in Boundary Scan Test, JTAG Boundary Scan

Understanding boundary scans means you need to understand the tools used when performing them. Take a look at our quick guide to boundary scan tools and make sure you have all you need. JTAG Device This refers to the device being tested during the boundary scan. Any device that is JTAG enabled will have information […]

Posted on January 20, 2018 in Boundary Scan, Boundary Scan Test, JTAG Boundary Scan

Are you new to boundary scans and JTAG? Take a look at this quick guide to understanding what exactly it means, and why JTAG is essential. JTAG stands for Joint Test Action Group. When referred to as part of a boundary scan test, it means computer chips and electronic devices that are made according to […]

Posted on November 28, 2017 in JTAG Boundary Scan

That’s an easy one. With onTAP’s TAP CONNECT JTAG Controller, you can run an unlimited number of chains simultaneously. Each TAP CONNECT JTAG Controller has two channels which provides the opportunity to run two chains simultaneously. Additional chains are easily handled with additional Controllers. There really are no restrictions on the number of chains that […]

Posted on June 12, 2017 in JTAG, JTAG Boundary Scan, onTAP, onTAP JTAG Blog

Once a board developer passes along the new board and all related files and procedures to a test developer, the boundary scan test process can begin. We recommend including the TAP Integrity Test at the beginning of your interconnect test because the TAP contains pins associated with the test access controller, e g., the TAP […]

Chip manufacturers are now producing multichip modules (MCMs) that may include two or more arrays of devices within a single package. These modules can be tested using JTAG test pattern generation of the devices while on a PCB. To incorporate JTAG testing of MCMs there are several things that are needed: a netlist of the […]